Identification
of the Mechanical Aspects of Material Removal Mechanisms in Chemical
Mechanical Polishing (CMP)
Yongsik
Moon and Kori Bevans
Sponsored
By: NSF / UC-SMART
Abstract
Mechanical
removal in CMP is isolated from chemical removal by using ‘abrasive-less’
slurry. It is believed that material properties, size, and geometry
of abrasives have a strong effect on the mechanical removal, which is
responsible for over 80% of total material removal.